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On-axis reverse hartmann test in aspheric optical surface test with the optical flat calibration

  • Zhengzheng Xi
  • , Mei Hui*
  • , Zhu Zhao
  • , Ming Liu
  • , Liquan Dong
  • , Xiaohua Liu
  • , Lingqin Kong
  • , Yuejin Zhao
  • *Corresponding author for this work
  • Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The Reverse Hartmann test is developed rapidly, robustly, and accurately in measuring precision aspheric surface. The onaxis design provides better control of the astigmatism in the test. We use an on-axis Hartmann test in reverse to measure the aspheric optical mirrors. In the configuration, the LCD with a light pattern on the screen illuminates to the tested surface, and a 2ìm-thick pellicle beam splitter is employed to obtain the coaxial light model. An optical flat withλ/20 surface precision is used to calibrate the rays which pass through the external pinhole and image at the detector, and the data are processed to obtain the direction vectors of arbitrary reflected rays. The surface gradients are determined by the spatial equations of incident and reflected rays which have been calibrated. The shape of surface is finally reconstructed by Zernike polynomial fitting. The experiments include measuring a 76.2mm off-axis parabolic mirror and a 76.2mm spherical mirror. The experimental results show coaxial reverse Hartmann test system may allow for accurate measurements with uncertainties in the micrometer range using cost-effective equipments.

Original languageEnglish
Title of host publicationReflection, Scattering, and Diffraction from Surfaces V
EditorsLeonard M. Hanssen
PublisherSPIE
ISBN (Electronic)9781510603134
DOIs
Publication statusPublished - 2016
EventReflection, Scattering, and Diffraction from Surfaces V - San Diego, United States
Duration: 28 Aug 201629 Aug 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9961
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceReflection, Scattering, and Diffraction from Surfaces V
Country/TerritoryUnited States
CitySan Diego
Period28/08/1629/08/16

Keywords

  • Fringe reflection
  • On-axis test system
  • Optical surface measurement
  • Reverse Hartmann test
  • Zernike polynomial fitting

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