TY - GEN
T1 - Numerical simulation and experimental verification of extended source interferometer
AU - Hou, Yinlong
AU - Li, Lin
AU - Wang, Shanshan
AU - Wang, Xiao
AU - Zang, Haijun
AU - Zhu, Qiudong
PY - 2013
Y1 - 2013
N2 - Extended source interferometer, compared with the classical point source interferometer, can suppress coherent noise of environment and system, decrease dust scattering effects and reduce high-frequency error of reference surface. Numerical simulation and experimental verification of extended source interferometer are discussed in this paper. In order to provide guidance for the experiment, the modeling of the extended source interferometer is realized by using optical design software Zemax. Matlab codes are programmed to rectify the field parameters of the optical system automatically and get a series of interferometric data conveniently. The communication technique of DDE (Dynamic Data Exchange) was used to connect Zemax and Matlab. Then the visibility of interference fringes can be calculated through adding the collected interferometric data. Combined with the simulation, the experimental platform of the extended source interferometer was established, which consists of an extended source, interference cavity and image collection system. The decrease of high-frequency error of reference surface and coherent noise of the environment is verified. The relation between the spatial coherence and the size, shape, intensity distribution of the extended source is also verified through the analysis of the visibility of interference fringes. The simulation result is in line with the result given by real extended source interferometer. Simulation result shows that the model can simulate the actual optical interference of the extended source interferometer quite well. Therefore, the simulation platform can be used to guide the experiment of interferometer which is based on various extended sources.
AB - Extended source interferometer, compared with the classical point source interferometer, can suppress coherent noise of environment and system, decrease dust scattering effects and reduce high-frequency error of reference surface. Numerical simulation and experimental verification of extended source interferometer are discussed in this paper. In order to provide guidance for the experiment, the modeling of the extended source interferometer is realized by using optical design software Zemax. Matlab codes are programmed to rectify the field parameters of the optical system automatically and get a series of interferometric data conveniently. The communication technique of DDE (Dynamic Data Exchange) was used to connect Zemax and Matlab. Then the visibility of interference fringes can be calculated through adding the collected interferometric data. Combined with the simulation, the experimental platform of the extended source interferometer was established, which consists of an extended source, interference cavity and image collection system. The decrease of high-frequency error of reference surface and coherent noise of the environment is verified. The relation between the spatial coherence and the size, shape, intensity distribution of the extended source is also verified through the analysis of the visibility of interference fringes. The simulation result is in line with the result given by real extended source interferometer. Simulation result shows that the model can simulate the actual optical interference of the extended source interferometer quite well. Therefore, the simulation platform can be used to guide the experiment of interferometer which is based on various extended sources.
KW - experimental verification
KW - extended source interferometer
KW - simulation analysis
KW - spatial coherence
UR - http://www.scopus.com/inward/record.url?scp=84899807497&partnerID=8YFLogxK
U2 - 10.1117/12.2038097
DO - 10.1117/12.2038097
M3 - Conference contribution
AN - SCOPUS:84899807497
SN - 9780819499646
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 2013 International Conference on Optical Instruments and Technology
PB - SPIE
T2 - 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Y2 - 17 November 2013 through 19 November 2013
ER -