Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma

Tao Cheng; Wen Zhong Huang; Li Min Meng; Ying Jun Li; Jing Zhao; Jie Zhang

Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma

Tao Cheng^*
, Wen Zhong Huang
, Li Min Meng
, Ying Jun Li
, Jing Zhao
, Jie Zhang

^*Corresponding author for this work

China University of Mining & Technology, Beijing
CAS - Institute of Physics
China Academy of Engineering Physics

Research output: Contribution to journal › Article › peer-review

Abstract

A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.

Original language	English
Pages (from-to)	2288-2291
Number of pages	4
Journal	Guangzi Xuebao/Acta Photonica Sinica
Volume	37
Issue number	11
Publication status	Published - Nov 2008
Externally published	Yes

Keywords

Absorption
Multilayers
Plasma
Reflectivity
X-ray laser

Cite this

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title = "Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma",

abstract = "A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.",

keywords = "Absorption, Multilayers, Plasma, Reflectivity, X-ray laser",

author = "Tao Cheng and Huang, \{Wen Zhong\} and Meng, \{Li Min\} and Li, \{Ying Jun\} and Jing Zhao and Jie Zhang",

year = "2008",

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language = "English",

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journal = "Guangzi Xuebao/Acta Photonica Sinica",

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T1 - Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma

AU - Cheng, Tao

AU - Huang, Wen Zhong

AU - Meng, Li Min

AU - Li, Ying Jun

AU - Zhao, Jing

AU - Zhang, Jie

PY - 2008/11

Y1 - 2008/11

N2 - A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.

AB - A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.

KW - Absorption

KW - Multilayers

KW - Plasma

KW - Reflectivity

KW - X-ray laser

UR - https://www.scopus.com/pages/publications/57949091677

M3 - Article

AN - SCOPUS:57949091677

SN - 1004-4213

VL - 37

SP - 2288

EP - 2291

JO - Guangzi Xuebao/Acta Photonica Sinica

JF - Guangzi Xuebao/Acta Photonica Sinica

IS - 11

ER -

Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma

Abstract

Keywords

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