New method of built-in self-testing for pulse doppler radar digital signal processor

Teng Long; Yamin Sun; Peikun He; Erke Mao

New method of built-in self-testing for pulse doppler radar digital signal processor

Teng Long^*
, Yamin Sun
, Peikun He
, Erke Mao

^*Corresponding author for this work

School of Information and Electronics

Beijing Institute of Technology

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A new method of built-in self-testing for pulse doppler radar digital signal processor was advanced. The method is between board-level testing and system-level testing, integrating system adjustment, on-line testing and off-line testing in one BIT system. The implementation of BIT was offered, and the fault-coverage-rate of "data rearrangement" module was calculated. This method had been successfully applied to a PD radar.

Original language	English
Pages (from-to)	748-752
Number of pages	5
Journal	Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume	17
Issue number	6
Publication status	Published - 1997

Keywords

Built-in self-test
Digital signal processor
Pulse doppler radar
Testable design

Cite this

@article{3d311abcc6c545a5b9418716810ba13d,

title = "New method of built-in self-testing for pulse doppler radar digital signal processor",

abstract = "A new method of built-in self-testing for pulse doppler radar digital signal processor was advanced. The method is between board-level testing and system-level testing, integrating system adjustment, on-line testing and off-line testing in one BIT system. The implementation of BIT was offered, and the fault-coverage-rate of {"}data rearrangement{"} module was calculated. This method had been successfully applied to a PD radar.",

keywords = "Built-in self-test, Digital signal processor, Pulse doppler radar, Testable design",

author = "Teng Long and Yamin Sun and Peikun He and Erke Mao",

year = "1997",

language = "English",

volume = "17",

pages = "748--752",

journal = "Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology",

issn = "1001-0645",

publisher = "Beijing Institute of Technology",

number = "6",

}

TY - JOUR

T1 - New method of built-in self-testing for pulse doppler radar digital signal processor

AU - Long, Teng

AU - Sun, Yamin

AU - He, Peikun

AU - Mao, Erke

PY - 1997

Y1 - 1997

N2 - A new method of built-in self-testing for pulse doppler radar digital signal processor was advanced. The method is between board-level testing and system-level testing, integrating system adjustment, on-line testing and off-line testing in one BIT system. The implementation of BIT was offered, and the fault-coverage-rate of "data rearrangement" module was calculated. This method had been successfully applied to a PD radar.

AB - A new method of built-in self-testing for pulse doppler radar digital signal processor was advanced. The method is between board-level testing and system-level testing, integrating system adjustment, on-line testing and off-line testing in one BIT system. The implementation of BIT was offered, and the fault-coverage-rate of "data rearrangement" module was calculated. This method had been successfully applied to a PD radar.

KW - Built-in self-test

KW - Digital signal processor

KW - Pulse doppler radar

KW - Testable design

UR - https://www.scopus.com/pages/publications/71149103843

M3 - Article

AN - SCOPUS:71149103843

SN - 1001-0645

VL - 17

SP - 748

EP - 752

JO - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

JF - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

IS - 6

ER -

New method of built-in self-testing for pulse doppler radar digital signal processor

Abstract

Keywords

Other files and links

Fingerprint

Cite this