Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices

Muzheng Xiao*, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Large aspheric optical mirrors and lens are wildly used in high-tech industry such as huge telescopes and synchrotron radiation facilities. The measurement uncertainty of the surfaces is needed to be under several tens of nanometers. Current methods such as interferometry method are not available for measuring aspheric surface with departure over hundreds of wavelength. In this paper, we proposed a new method called improved 3D deflectometry method. Rotatable optical devices are applied to enlarge the measuring range of autocollimator with highly accuracy but small measuring range. Data processing methods are also proposed to improve the measurement uncertainty. Experimental setup is designed based on proposed method. Spherical concave mirror with curvature radius of 5000 mm is measured successfully. The repeatability (mean standard deviation) of 10 times measurement is less than 10 nanometers.

Original languageEnglish
Title of host publicationOptical Manufacturing and Testing IX
DOIs
Publication statusPublished - 2011
Externally publishedYes
EventOptical Manufacturing and Testing IX - San Diego, CA, United States
Duration: 22 Aug 201124 Aug 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8126
ISSN (Print)0277-786X

Conference

ConferenceOptical Manufacturing and Testing IX
Country/TerritoryUnited States
CitySan Diego, CA
Period22/08/1124/08/11

Keywords

  • Aspheric surface
  • Autocollimator
  • Profile measurement
  • Scanning deflectometry

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