Multiple ionization effects in M X-ray emission induced by heavy ions

Xing Wang, Yongtao Zhao*, Rui Cheng, Xianming Zhou, Ge Xu, Yuanbo Sun, Yu Lei, Yuyu Wang, Jieru Ren, Yang Yu, Yongfeng Li, Xiaoan Zhang, Yaozong Li, Changhui Liang, Guoqing Xiao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

M-shell ionization of tungsten by Ar 12+ ions were investigated in the energy range of 1.2-3.0 MeV. The measurements were also implemented for H, He and Xe ions as a comparative study. A significant shift of the M X-ray lines to the higher energy side caused by multiple ionizations, which was verified by the analysis of the intensity ratios of M γ and M αβ, was observed. The total experimental cross sections of tungsten were compared with the PWBA and ECPSSR theoretical predictions, which are based on two extreme assumptions, namely, single ionization and full ionization.

Original languageEnglish
Pages (from-to)1197-1200
Number of pages4
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume376
Issue number14
DOIs
Publication statusPublished - 5 Mar 2012
Externally publishedYes

Keywords

  • Heavy ions
  • Ionization cross section
  • Multiple ionization effect
  • X-ray emission

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