Modeling and characteristic of the vertical bonding-wire interconnection in Ka-band

Dawei An*, Xiang Li, Jinchao Mou, Xin Lv

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)

Abstract

This paper announced a new type of bonding interconnect - vertical bonding interconnect. Bonding interconnect is the critical technique for realizing the interconnection of microwave chip. The height, distance, number of wires and joint space of bonding interconnect have important effects on its microwave characteristics. In this paper, commercial 3D electromagnetic analysis software HFSS, microwave circuit design software ADS and Agilent vector network analyzer were used to model, simulate and optimize for the microwave characteristics of bonding interconnect, and produce the model, experimental results shown in this paper.

Original languageEnglish
Title of host publication2008 Global Symposium on Millimeter Waves, Proceeding, GSMM 2008
PublisherIEEE Computer Society
Pages229-232
Number of pages4
ISBN (Print)9781424418855
DOIs
Publication statusPublished - 2008
Event2008 Global Symposium on Millimeter Waves, GSMM 2008 - Nanjing, China
Duration: 21 Apr 200824 Apr 2008

Publication series

Name2008 Global Symposium on Millimeter Waves, Proceeding, GSMM 2008

Conference

Conference2008 Global Symposium on Millimeter Waves, GSMM 2008
Country/TerritoryChina
CityNanjing
Period21/04/0824/04/08

Keywords

  • Microwave chip
  • Stacked die package
  • Vertical bonding wire interconnection

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