Modeling and analyzing supply chain reliability by different effects of failure nodes

Lun Ran; Xujie Jia; Rongjie Tian

doi:10.1109/ICIII.2009.555

Modeling and analyzing supply chain reliability by different effects of failure nodes

Lun Ran^*
, Xujie Jia
, Rongjie Tian

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

From the viewpoint of a distributed service process, an ion-channel based method was proposed to analyze the reliability of supply chains. An analytic method was presented to determine the reliability of supply chains for logistics systems. New models were built to consider the following situations: when the nodes failed, different defect states had different measures and effects on the system. A Markov model was introduced to analyze the system safety and aggregate states to get the number of repairs and length of time before the system became dangerous by using ion-channel modeling theory. Finally a numerical example was presented to illustrate the results obtained in this paper.

Original language	English
Title of host publication	2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009
Pages	396-400
Number of pages	5
DOIs	https://doi.org/10.1109/ICIII.2009.555
Publication status	Published - 2009
Event	2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009 - Xi'an, China Duration: 26 Dec 2009 → 27 Dec 2009

Publication series

Name	2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009
Volume	4

Conference

Conference	2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009
Country/Territory	China
City	Xi'an
Period	26/12/09 → 27/12/09

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Failed-dangerous
Failed-safe
Ion-channel
Markov model
Supply Chain

Access to Document

10.1109/ICIII.2009.555

Cite this

Ran, L., Jia, X., & Tian, R. (2009). Modeling and analyzing supply chain reliability by different effects of failure nodes. In 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009 (pp. 396-400). Article 5370249 (2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009; Vol. 4). https://doi.org/10.1109/ICIII.2009.555

Ran, Lun ; Jia, Xujie ; Tian, Rongjie. / Modeling and analyzing supply chain reliability by different effects of failure nodes. 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009. 2009. pp. 396-400 (2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009).

@inproceedings{6198fd4af46e424d8e974b1e734201e9,

title = "Modeling and analyzing supply chain reliability by different effects of failure nodes",

abstract = "From the viewpoint of a distributed service process, an ion-channel based method was proposed to analyze the reliability of supply chains. An analytic method was presented to determine the reliability of supply chains for logistics systems. New models were built to consider the following situations: when the nodes failed, different defect states had different measures and effects on the system. A Markov model was introduced to analyze the system safety and aggregate states to get the number of repairs and length of time before the system became dangerous by using ion-channel modeling theory. Finally a numerical example was presented to illustrate the results obtained in this paper.",

keywords = "Failed-dangerous, Failed-safe, Ion-channel, Markov model, Supply Chain",

author = "Lun Ran and Xujie Jia and Rongjie Tian",

year = "2009",

doi = "10.1109/ICIII.2009.555",

language = "English",

isbn = "9780769538761",

series = "2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009",

pages = "396--400",

booktitle = "2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009",

note = "2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009 ; Conference date: 26-12-2009 Through 27-12-2009",

}

Ran, L, Jia, X & Tian, R 2009, Modeling and analyzing supply chain reliability by different effects of failure nodes. in 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009., 5370249, 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009, vol. 4, pp. 396-400, 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009, Xi'an, China, 26/12/09. https://doi.org/10.1109/ICIII.2009.555

Modeling and analyzing supply chain reliability by different effects of failure nodes. / Ran, Lun; Jia, Xujie; Tian, Rongjie.
2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009. 2009. p. 396-400 5370249 (2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009; Vol. 4).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Modeling and analyzing supply chain reliability by different effects of failure nodes

AU - Ran, Lun

AU - Jia, Xujie

AU - Tian, Rongjie

PY - 2009

Y1 - 2009

N2 - From the viewpoint of a distributed service process, an ion-channel based method was proposed to analyze the reliability of supply chains. An analytic method was presented to determine the reliability of supply chains for logistics systems. New models were built to consider the following situations: when the nodes failed, different defect states had different measures and effects on the system. A Markov model was introduced to analyze the system safety and aggregate states to get the number of repairs and length of time before the system became dangerous by using ion-channel modeling theory. Finally a numerical example was presented to illustrate the results obtained in this paper.

AB - From the viewpoint of a distributed service process, an ion-channel based method was proposed to analyze the reliability of supply chains. An analytic method was presented to determine the reliability of supply chains for logistics systems. New models were built to consider the following situations: when the nodes failed, different defect states had different measures and effects on the system. A Markov model was introduced to analyze the system safety and aggregate states to get the number of repairs and length of time before the system became dangerous by using ion-channel modeling theory. Finally a numerical example was presented to illustrate the results obtained in this paper.

KW - Failed-dangerous

KW - Failed-safe

KW - Ion-channel

KW - Markov model

KW - Supply Chain

UR - https://www.scopus.com/pages/publications/77649292683

U2 - 10.1109/ICIII.2009.555

DO - 10.1109/ICIII.2009.555

M3 - Conference contribution

AN - SCOPUS:77649292683

SN - 9780769538761

T3 - 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009

SP - 396

EP - 400

BT - 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009

T2 - 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009

Y2 - 26 December 2009 through 27 December 2009

ER -

Ran L, Jia X, Tian R. Modeling and analyzing supply chain reliability by different effects of failure nodes. In 2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009. 2009. p. 396-400. 5370249. (2009 International Conference on Information Management, Innovation Management and Industrial Engineering, ICIII 2009). doi: 10.1109/ICIII.2009.555

Modeling and analyzing supply chain reliability by different effects of failure nodes

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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