Modeling and analysis of vertical noise coupling between clock tree and channel routing wire in 3D mixed signal integration

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper reports on the vertical noise coupling between a clock wire in digital IC and channel routing wires in analog IC in 3D mixed signal integration. Full wave electromagnetic simulations are employed to evaluate the vertical noise coupling. The coupling mechanism is discussed with transfer impedance. Insights to vertical noise coupling between interconnects in 3D integration are offered and possible solutions are provided to reduce the noise.

Original languageEnglish
Title of host publication2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference, IITC/MAM 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages79-81
Number of pages3
ISBN (Electronic)9781467373562
DOIs
Publication statusPublished - 10 Nov 2015
EventIEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference, IITC/MAM 2015 - Grenoble, France
Duration: 18 May 201521 May 2015

Publication series

Name2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference, IITC/MAM 2015

Conference

ConferenceIEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference, IITC/MAM 2015
Country/TerritoryFrance
CityGrenoble
Period18/05/1521/05/15

Keywords

  • channel routing wire
  • clock tree
  • signal integrity
  • three-dimensional integrated circuits (3D-IC)
  • vertical coupling noise

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