Mixed excitation mechanism in solid-state cathodoluminescence structure

Lei Qian; Feng Teng; Shengyi Yang; Shanyu Quan

doi:10.1016/j.cplett.2005.02.057

Mixed excitation mechanism in solid-state cathodoluminescence structure

Lei Qian^*, Feng Teng, Shengyi Yang, Shanyu Quan

^*Corresponding author for this work

Beijing Jiaotong University

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Mixed excitation was observed based on solid-state cathodoluminescence (SSCL) structures under alternating-current (AC) applied voltages, and it combines charge carrier injection recombination and hot electron impact excitation. Under AC voltages of 500 Hz, the electroluminescence from an ITO/SiO_x/MEH-PPV/SiO_x/Al device contained two emission bands: a blue emission band peak at 3.02 eV (410 nm) and an orange emission band peak at 2.10 eV (590 nm). The source of these two emission bands was investigated. Our experimental results suggest that the orange emission comes from the recombination of MEH-PPV excitons, and the blue emission is from oxygen defects and interface states of SiO_x.

Original language	English
Pages (from-to)	389-392
Number of pages	4
Journal	Chemical Physics Letters
Volume	405
Issue number	4-6
DOIs	https://doi.org/10.1016/j.cplett.2005.02.057
Publication status	Published - 12 Apr 2005
Externally published	Yes

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10.1016/j.cplett.2005.02.057

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@article{2110b3615b104adebdea59b7a591baa3,

title = "Mixed excitation mechanism in solid-state cathodoluminescence structure",

abstract = "Mixed excitation was observed based on solid-state cathodoluminescence (SSCL) structures under alternating-current (AC) applied voltages, and it combines charge carrier injection recombination and hot electron impact excitation. Under AC voltages of 500 Hz, the electroluminescence from an ITO/SiOx/MEH-PPV/SiOx/Al device contained two emission bands: a blue emission band peak at 3.02 eV (410 nm) and an orange emission band peak at 2.10 eV (590 nm). The source of these two emission bands was investigated. Our experimental results suggest that the orange emission comes from the recombination of MEH-PPV excitons, and the blue emission is from oxygen defects and interface states of SiOx.",

author = "Lei Qian and Feng Teng and Shengyi Yang and Shanyu Quan",

year = "2005",

month = apr,

day = "12",

doi = "10.1016/j.cplett.2005.02.057",

language = "English",

volume = "405",

pages = "389--392",

journal = "Chemical Physics Letters",

issn = "0009-2614",

publisher = "Elsevier B.V.",

number = "4-6",

}

TY - JOUR

T1 - Mixed excitation mechanism in solid-state cathodoluminescence structure

AU - Qian, Lei

AU - Teng, Feng

AU - Yang, Shengyi

AU - Quan, Shanyu

PY - 2005/4/12

Y1 - 2005/4/12

N2 - Mixed excitation was observed based on solid-state cathodoluminescence (SSCL) structures under alternating-current (AC) applied voltages, and it combines charge carrier injection recombination and hot electron impact excitation. Under AC voltages of 500 Hz, the electroluminescence from an ITO/SiOx/MEH-PPV/SiOx/Al device contained two emission bands: a blue emission band peak at 3.02 eV (410 nm) and an orange emission band peak at 2.10 eV (590 nm). The source of these two emission bands was investigated. Our experimental results suggest that the orange emission comes from the recombination of MEH-PPV excitons, and the blue emission is from oxygen defects and interface states of SiOx.

AB - Mixed excitation was observed based on solid-state cathodoluminescence (SSCL) structures under alternating-current (AC) applied voltages, and it combines charge carrier injection recombination and hot electron impact excitation. Under AC voltages of 500 Hz, the electroluminescence from an ITO/SiOx/MEH-PPV/SiOx/Al device contained two emission bands: a blue emission band peak at 3.02 eV (410 nm) and an orange emission band peak at 2.10 eV (590 nm). The source of these two emission bands was investigated. Our experimental results suggest that the orange emission comes from the recombination of MEH-PPV excitons, and the blue emission is from oxygen defects and interface states of SiOx.

UR - http://www.scopus.com/inward/record.url?scp=15944365165&partnerID=8YFLogxK

U2 - 10.1016/j.cplett.2005.02.057

DO - 10.1016/j.cplett.2005.02.057

M3 - Article

AN - SCOPUS:15944365165

SN - 0009-2614

VL - 405

SP - 389

EP - 392

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 4-6

ER -

Mixed excitation mechanism in solid-state cathodoluminescence structure

Abstract

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