Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

Zhi Bo Sheng; Fu Cong Chen; Pei Yu Xiong; Qi Ru Yi; Jie Yuan; Yu Chen; Yue Liang Gu; Kui Jin; Huan Hua Wang; Xiao Long Li; Chen Gao

doi:10.1088/1674-1056/adb261

Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

Zhi Bo Sheng, Fu Cong Chen, Pei Yu Xiong, Qi Ru Yi, Jie Yuan, Yu Chen, Yue Liang Gu, Kui Jin, Huan Hua Wang, Xiao Long Li, Chen Gao^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

YBa₂Cu₃O_7−x (YBCO) films with low microwave surface resistance (R_S) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence R_S significantly. In this work, we deposited highly c-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain R_S dependence on the oxygen pressure.

Original language	English
Article number	046105
Journal	Chinese Physics B
Volume	34
Issue number	4
DOIs	https://doi.org/10.1088/1674-1056/adb261
Publication status	Published - 1 Mar 2025
Externally published	Yes

Keywords

microstructure, microwave surface resistance
reciprocal space mapping
YBCO films

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10.1088/1674-1056/adb261

Cite this

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title = "Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures",

abstract = "YBa2Cu3O7−x (YBCO) films with low microwave surface resistance (RS) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence RS significantly. In this work, we deposited highly c-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain RS dependence on the oxygen pressure.",

keywords = "microstructure, microwave surface resistance, reciprocal space mapping, YBCO films",

author = "Sheng, {Zhi Bo} and Chen, {Fu Cong} and Xiong, {Pei Yu} and Yi, {Qi Ru} and Jie Yuan and Yu Chen and Gu, {Yue Liang} and Kui Jin and Wang, {Huan Hua} and Li, {Xiao Long} and Chen Gao",

note = "Publisher Copyright: {\textcopyright} 2025 Chinese Physical Society and IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.",

year = "2025",

month = mar,

day = "1",

doi = "10.1088/1674-1056/adb261",

language = "English",

volume = "34",

journal = "Chinese Physics B",

issn = "1674-1056",

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TY - JOUR

T1 - Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

AU - Sheng, Zhi Bo

AU - Chen, Fu Cong

AU - Xiong, Pei Yu

AU - Yi, Qi Ru

AU - Yuan, Jie

AU - Chen, Yu

AU - Gu, Yue Liang

AU - Jin, Kui

AU - Wang, Huan Hua

AU - Li, Xiao Long

AU - Gao, Chen

PY - 2025/3/1

Y1 - 2025/3/1

N2 - YBa2Cu3O7−x (YBCO) films with low microwave surface resistance (RS) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence RS significantly. In this work, we deposited highly c-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain RS dependence on the oxygen pressure.

AB - YBa2Cu3O7−x (YBCO) films with low microwave surface resistance (RS) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence RS significantly. In this work, we deposited highly c-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain RS dependence on the oxygen pressure.

KW - microstructure, microwave surface resistance

KW - reciprocal space mapping

KW - YBCO films

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U2 - 10.1088/1674-1056/adb261

DO - 10.1088/1674-1056/adb261

M3 - Article

AN - SCOPUS:105001137089

SN - 1674-1056

VL - 34

JO - Chinese Physics B

JF - Chinese Physics B

IS - 4

M1 - 046105

ER -

Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

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Keywords

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