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Mechanism-Informed Fault Diagnosis of Battery Thermal Runaway Using CRS-DenseNet with Risk Accumulation Features

  • Zijun Hao
  • , Ni Lin*
  • , Yongdong Gao
  • *Corresponding author for this work
  • Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The widespread transition to electric mobility has made battery safety an urgent engineering challenge. Conventional diagnostics relying on instantaneous battery management system (BMS) telemetry often overlook long-term degradation cues. To address this, we present a mechanismguided diagnostic architecture that utilizes real-world EV fleet data, pivoting to a risk accumulation paradigm rather than relying solely on real-time snapshots. By merging a populationlevel Comprehensive Risk Score (CRS) with a DenseNet neural architecture, we establish a dual-validation framework for robust feature selection and non-linear mapping. Evaluated against real-world data, the proposed model yields a flawless 100% diagnostic accuracy. Furthermore, utilizing SHapley Additive exPlanations (SHAP) for model interpretation successfully decouples feature contributions, pinpointing prolonged exposure to high state-of-charge (SOC) paired with mid-to-high C-rate charging as the primary catalysts for failure, thereby guiding targeted BMS calibration and optimization.

Original languageEnglish
Title of host publication2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages761-765
Number of pages5
ISBN (Electronic)9798331559076
DOIs
Publication statusPublished - 2026
Externally publishedYes
Event2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026 - Changchun, China
Duration: 29 May 2026 → 31 May 2026

Publication series

Name2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026

Conference

Conference2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
Country/TerritoryChina
CityChangchun
Period29/05/26 → 31/05/26

Keywords

  • Battery
  • Fault diagnosis
  • Risk accumulation
  • SHAP

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