Measurements of photoconductive switches with an ultrafast scanning tunneling microscope

Tian Lan, Guoqiang Ni*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

We present experimental results of time-resolved signals of photoconductive (PC) switches with an ultrafast scanning tunneling microscope, which combines ultrashort laser techniques with scanning tunneling microscope (STM) to obtain simultaneous high temporal and spatial resolution. The picosecond electrical transients were generated by optically exciting the photoconductive switch between a high-speed coplanar strip transmission lines. The measured PC switch demonstrated a linear relation between the amplitudes of the time-resolved pulse signals and the photoconductive currents as well as a linear relation between the amplitudes ofthe signals and the bias voltage applied to the PC switch. The resolved transient signal in contact mode showed a FWHM of 3.2 ps, and the transient signals in non-contact mode were from the capacitive coupling between the tip and the coplanar transmission line.

Original languageEnglish
Pages (from-to)114-118
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4923
DOIs
Publication statusPublished - 5 Sept 2002
EventNano-Optics and Nano-Structures 2002 - Shanghai, China
Duration: 14 Oct 200218 Oct 2002

Keywords

  • Photoconductive switch
  • Transient measurements
  • Ultrafast scanning tunnel ing microscope (ustm)

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