Abstract
In this paper, the principle of subaperture stitching interferometry was introduced. A testing stage with five degrees of freedom for stitching interferometry was built. A model based on least-squares method and error averaging method for data processing was established, which could reduce error accumulation and improve the precision. A 100 mm plane mirror was measured with a 50 mm aperture interferometer by means of stitching interferometry. Compared with the results by a 100 mm interferometer, peak to valley (PV) and root mean square (RMS) of the phase distribution residual are 0:0038λ and 0:0004λ, respectively. It proved that the model and method are helpful for large optical measurement.
| Original language | English |
|---|---|
| Pages (from-to) | 218-223 |
| Number of pages | 6 |
| Journal | Frontiers of Optoelectronics |
| Volume | 5 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Jun 2012 |
| Externally published | Yes |
Keywords
- interferometry
- residual error
- subaperture stitching
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