TY - GEN
T1 - Local cell stiffness measurement using probes deformation
AU - Takeuchi, Masaru
AU - Bin Ahmad, Mohd Ridzuan
AU - Nakajima, Masahiro
AU - Fukuda, Toshio
AU - Umeshima, Hiroki
AU - Kengaku, Mineko
AU - Hasegawa, Yasuhisa
AU - Huang, Qiang
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/11/26
Y1 - 2014/11/26
N2 - In this paper, we propose and demonstrate a new method for local cell stiffness measurement using multiple probes system. Thin glass pipettes were employed to measure the stiffness of cells on a general culture dish. The thin micropipettes were prepared and their spring constant was measured using the Atomic Force Microscopy (AFM) cantilever before stiffness measurement. The deformation of the pipette tips and the cell were observed under an optical microscope. The cell stiffness was calculated from the deformations based on the Hooke's low. The measurement results show that the myoblast C2C12 cell on a glass substrate has the stiffness around 0.1 N/m. The experimental results indicate that the proposed method can conduct the time-lapse cell stiffness measurement at multiple points simultaneously.
AB - In this paper, we propose and demonstrate a new method for local cell stiffness measurement using multiple probes system. Thin glass pipettes were employed to measure the stiffness of cells on a general culture dish. The thin micropipettes were prepared and their spring constant was measured using the Atomic Force Microscopy (AFM) cantilever before stiffness measurement. The deformation of the pipette tips and the cell were observed under an optical microscope. The cell stiffness was calculated from the deformations based on the Hooke's low. The measurement results show that the myoblast C2C12 cell on a glass substrate has the stiffness around 0.1 N/m. The experimental results indicate that the proposed method can conduct the time-lapse cell stiffness measurement at multiple points simultaneously.
UR - https://www.scopus.com/pages/publications/84919472775
U2 - 10.1109/NANO.2014.6968035
DO - 10.1109/NANO.2014.6968035
M3 - Conference contribution
AN - SCOPUS:84919472775
T3 - Proceedings of the IEEE Conference on Nanotechnology
SP - 168
EP - 171
BT - Proceedings of the IEEE Conference on Nanotechnology
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014
Y2 - 18 August 2014 through 21 August 2014
ER -