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Learning Dense Feature Matching via Lifting Single 2D Image to 3D Space

  • Yingping Liang
  • , Yutao Hu
  • , Wenqi Shao
  • , Ying Fu*
  • *Corresponding author for this work
  • Beijing Institute of Technology
  • Southeast University, Nanjing
  • Shanghai AI Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Feature matching plays a fundamental role in many computer vision tasks, yet existing methods rely on scarce and clean multi-view image collections, which constrains their generalization to diverse and challenging scenarios. Moreover, conventional feature encoders are typically trained on single-view 2D images, limiting their capacity to capture 3D-aware correspondences. In this paper, we propose a novel two-stage framework that lifts 2D images to 3D space, named as Lift to Match (L2M), taking full advantage of large-scale and diverse single-view images. To be specific, in the first stage, we learn a 3D-aware feature encoder using a combination of multi-view image synthesis and 3D feature Gaussian representation, which injects 3D geometry knowledge into the encoder. In the second stage, a novelview rendering strategy, combined with large-scale synthetic data generation from single-view images, is employed to learn a feature decoder for robust feature matching, thus achieving generalization across diverse domains. Extensive experiments demonstrate that our method achieves superior generalization across zero-shot evaluation benchmarks, highlighting the effectiveness of the proposed framework for robust feature matching. Code is available at https://github.com/Sharpiless/L2M.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6621-6631
Number of pages11
ISBN (Electronic)9798331587758
DOIs
Publication statusPublished - 2025
Event2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Honolulu, United States
Duration: 19 Oct 202523 Oct 2025

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499
ISSN (Electronic)2380-7504

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2523/10/25

Keywords

  • data generation
  • deep learning
  • feature matching

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