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Layer-Dependent Pressure Effect on the Electronic Structure of 2D Black Phosphorus

  • Shenyang Huang
  • , Yang Lu
  • , Fanjie Wang
  • , Yuchen Lei
  • , Chaoyu Song
  • , Jiasheng Zhang
  • , Qiaoxia Xing
  • , Chong Wang
  • , Yuangang Xie
  • , Lei Mu
  • , Guowei Zhang
  • , Hao Yan
  • , Bin Chen
  • , Hugen Yan
  • Fudan University
  • Center for High Pressure Science & Technology Advanced Research
  • Northwestern Polytechnical University Xian
  • CAS - Institute of Deep-Sea Science and Engineering
  • Collaborative Innovation Center of Advanced Microstructures

Research output: Contribution to journalArticlepeer-review

Abstract

Through infrared spectroscopy, we systematically study the pressure effect on electronic structures of few-layer black phosphorus (BP) with layer number ranging from 2 to 13. We reveal that the pressure-induced shift of optical transitions exhibits strong layer dependence. In sharp contrast to the bulk counterpart which undergoes a semiconductor to semimetal transition under , the band gap of 2 L increases with increasing pressure until beyond 2 GPa. Meanwhile, for a sample with a given layer number, the pressure-induced shift also differs for transitions with different indices. Through the tight-binding model in conjunction with a Morse potential for the interlayer coupling, this layer- and transition-index-dependent pressure effect can be fully accounted. Our study paves a way for versatile van der Waals engineering of two-dimensional BP.

Original languageEnglish
Article number186401
JournalPhysical Review Letters
Volume127
Issue number18
DOIs
Publication statusPublished - 29 Oct 2021
Externally publishedYes

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