K-shell X-ray production in Silicon (Z2 = 14) by (1 ≤ Z1 ≤ 53) slow ions

Yu Lei, Yongtao Zhao*, Xianming Zhou, Rui Cheng, Xing Wang, Yuanbo Sun, Shidong Liu, Jieru Ren, Yuyu Wang, Xiaoan Zhang, Yaozong Li, Changhui Liang, Guoqing Xiao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

K-shell X-ray emission of Silicon induced by near-Bohr-velocity ions was systematically investigated in collision systems for which the ratio of projectile-to-target atomic numbers (Z1/Z2) ranged from 0.07 to 3.79. The results show that, in asymmetric collisions, the measured K-shell X-ray production cross sections of Silicon fit very well with the predictions of different direct ionization models depending on the atomic number of projectile. In the case of near-symmetric collisions (Z1/Z2 ∼ 1), an obvious enhancement of the X-ray production cross section was observed, which can be attributed to the vacancy transfer within the framework of quasi-molecular model.

Original languageEnglish
Pages (from-to)10-13
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume370
DOIs
Publication statusPublished - 1 Mar 2016
Externally publishedYes

Keywords

  • Direct ionization
  • Near Bohr velocity
  • Quasi-molecular model
  • X-ray production cross section

Fingerprint

Dive into the research topics of 'K-shell X-ray production in Silicon (Z2 = 14) by (1 ≤ Z1 ≤ 53) slow ions'. Together they form a unique fingerprint.

Cite this