Investigation of the key sampling parameters of Antenna time domain planar near field measurement

Ren Chang*, Zheng Hui Xue, Nan Wang, Shi Ming Yang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Investigation of optimizing the scanning setup parameters of the sampling system in antenna time domain planar near field measurement is described in this paper. Based on this technique, the sample waveforms are got more accurately in practical experiments. From the measuring results, the measuring results and sample efficiency are much influenced by sample setup can be found. So it is very necessary to find the best setup parameters through research.

Original languageEnglish
Title of host publication2008 International Conference on Microwave and Millimeter Wave Technology Proceedings, ICMMT
Pages910-913
Number of pages4
DOIs
Publication statusPublished - 2008
Event2008 International Conference on Microwave and Millimeter Wave Technology, ICMMT - Nanjing, China
Duration: 21 Apr 200824 Apr 2008

Publication series

Name2008 International Conference on Microwave and Millimeter Wave Technology Proceedings, ICMMT
Volume2

Conference

Conference2008 International Conference on Microwave and Millimeter Wave Technology, ICMMT
Country/TerritoryChina
CityNanjing
Period21/04/0824/04/08

Keywords

  • Near field measurement
  • Near-field-far-field transformations
  • Sampling parameters

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