Investigation of the fatigue damage mechanism of Inconel 617 at elevated temperatures obtained by in situ SEM fatigue tests

Qiang Wang, Xishu Wang*, Naiqiang Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

In the present study, fatigue damage evolution of Inconel 617 at 600 °C and 700 °C was investigated by using an in situ scanning electron microscope (SEM) fatigue test. The fatigue crack initiation and propagation processes were directly observed and recorded online. Fractography and microstructure analyses were performed to further reveal the mechanism of high-temperature failure. Experimental results showed that Inconel 617 was not sensitive to an artificial notch even if the curvature reached approximately a hundred microns, and it was more vulnerable to intergranular fracture. This alloy showed multiple crack initiation and propagation behavior at high temperatures. Multiple crack initiation sites did not occur in the same planes, and the number of crack initiation sites increased with increasing environmental temperature. Intergranular cracking behavior was observed in the near surface region, and transgranular crack initiation and propagation were mainly observed in the interior. Coarsening and discrete M23C6-type carbides formed at grain boundaries were the main factors responsible for intergranular cracking. The twin boundary (TB) was directly observed as the crack initiation site, and it retarded crack propagation along the TB and changed the crack propagation mode.

Original languageEnglish
Article number106518
JournalInternational Journal of Fatigue
Volume153
DOIs
Publication statusPublished - Dec 2021
Externally publishedYes

Keywords

  • Grain boundary carbides
  • In situ SEM fatigue test
  • Inconel 617
  • Intergranular fracture
  • Multiple crack initiation

Fingerprint

Dive into the research topics of 'Investigation of the fatigue damage mechanism of Inconel 617 at elevated temperatures obtained by in situ SEM fatigue tests'. Together they form a unique fingerprint.

Cite this