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Investigation of defect clusters in ion-irradiated Ni and NiCo using diffuse X-ray scattering and electron microscopy
Raina J. Olsen*, Ke Jin, Chenyang Lu, Laurent K. Beland, Lumin Wang, Hongbin Bei, Eliot D. Specht, Bennett C. Larson
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
28
Citations
(Scopus)