Interface and defect characterization in hot-pressed ZrB2-SiC ceramics

Jun Liang; Yu Wang; Songhe Meng

doi:10.1016/j.ijrmhm.2010.12.010

Interface and defect characterization in hot-pressed ZrB₂-SiC ceramics

Jun Liang
, Yu Wang^*
, Songhe Meng

^*Corresponding author for this work

Harbin Institute of Technology

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

ZrB₂ is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB₂-20 vol.% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB₂-SiC ceramics. Numerous edge dislocations were found in ZrB₂ grains. There was no interfacial amorphous layer or transition layer at the ZrB₂/6H-SiC interface. Note also that since only one of the constituents (ZrB₂ or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB₂.

Original language	English
Pages (from-to)	341-343
Number of pages	3
Journal	International Journal of Refractory Metals and Hard Materials
Volume	29
Issue number	3
DOIs	https://doi.org/10.1016/j.ijrmhm.2010.12.010
Publication status	Published - May 2011
Externally published	Yes

Keywords

Defect
Electron microscopy
Interface
ZrB-SiC ceramics

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10.1016/j.ijrmhm.2010.12.010

Cite this

@article{2884a0b588a648e6a5e07de787e7ced5,

title = "Interface and defect characterization in hot-pressed ZrB2-SiC ceramics",

abstract = "ZrB2 is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB2-20 vol.\% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB2-SiC ceramics. Numerous edge dislocations were found in ZrB2 grains. There was no interfacial amorphous layer or transition layer at the ZrB2/6H-SiC interface. Note also that since only one of the constituents (ZrB2 or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB2.",

keywords = "Defect, Electron microscopy, Interface, ZrB-SiC ceramics",

author = "Jun Liang and Yu Wang and Songhe Meng",

year = "2011",

month = may,

doi = "10.1016/j.ijrmhm.2010.12.010",

language = "English",

volume = "29",

pages = "341--343",

journal = "International Journal of Refractory Metals and Hard Materials",

issn = "0263-4368",

publisher = "Elsevier B.V.",

number = "3",

}

TY - JOUR

T1 - Interface and defect characterization in hot-pressed ZrB2-SiC ceramics

AU - Liang, Jun

AU - Wang, Yu

AU - Meng, Songhe

PY - 2011/5

Y1 - 2011/5

N2 - ZrB2 is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB2-20 vol.% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB2-SiC ceramics. Numerous edge dislocations were found in ZrB2 grains. There was no interfacial amorphous layer or transition layer at the ZrB2/6H-SiC interface. Note also that since only one of the constituents (ZrB2 or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB2.

AB - ZrB2 is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB2-20 vol.% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB2-SiC ceramics. Numerous edge dislocations were found in ZrB2 grains. There was no interfacial amorphous layer or transition layer at the ZrB2/6H-SiC interface. Note also that since only one of the constituents (ZrB2 or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB2.

KW - Defect

KW - Electron microscopy

KW - Interface

KW - ZrB-SiC ceramics

UR - https://www.scopus.com/pages/publications/79952533597

U2 - 10.1016/j.ijrmhm.2010.12.010

DO - 10.1016/j.ijrmhm.2010.12.010

M3 - Article

AN - SCOPUS:79952533597

SN - 0263-4368

VL - 29

SP - 341

EP - 343

JO - International Journal of Refractory Metals and Hard Materials

JF - International Journal of Refractory Metals and Hard Materials

IS - 3

ER -

Interface and defect characterization in hot-pressed ZrB₂-SiC ceramics

Abstract

Keywords

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