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Integrated test system of infrared and laser data based on USB 3.0

  • Hui Quan Fu
  • , Lin Bo Tang
  • , Chao Zhang
  • , Bao Jun Zhao
  • , Mao Wen Li
  • Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Based on USB3.0, this paper presents the design method of an integrated test system for both infrared image data and laser signal data processing module. The core of the design is FPGA logic control, the design uses dual-chip DDR3 SDRAM to achieve high-speed laser data cache, and receive parallel LVDS image data through serial-to-parallel conversion chip, and it achieves high-speed data communication between the system and host computer through the USB3.0 bus. The experimental results show that the developed PC software realizes the real-time display of 14-bit LVDS original image after 14-to-8 bit conversion and JPEG2000 compressed image after decompression in software, and can realize the real-time display of the acquired laser signal data. The correctness of the test system design is verified, indicating that the interface link is normal.

Original languageEnglish
Title of host publicationNinth International Conference on Digital Image Processing, ICDIP 2017
EditorsXudong Jiang, Charles M. Falco
PublisherSPIE
ISBN (Electronic)9781510613041
DOIs
Publication statusPublished - 2017
Event9th International Conference on Digital Image Processing, ICDIP 2017 - Hong Kong, China
Duration: 19 May 201722 May 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10420
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference9th International Conference on Digital Image Processing, ICDIP 2017
Country/TerritoryChina
CityHong Kong
Period19/05/1722/05/17

Keywords

  • FPGA
  • USB 3.0
  • display
  • high speed
  • host computer

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