Initial growth mechanism of atomic layer deposited titanium dioxide using cyclopentadienyl-type precursor: A density functional theory study

Guangfen Zhou, Jie Ren*, Shaowen Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

The initial reaction mechanism of atomic layer deposited TiO2 thin film on the silicon surface using Cp*Ti(OCH3)3 as the metal precursor has been investigated by using the density functional theory. We find that Cp*Ti(OCH3)3 adsorbed state can be formed via the hydrogen bonding interaction between CH3O ligands and the SiOH sites, which is in good agreement with the quadrupole mass spectrometry (QMS) experimental observations. Moreover, the desorption of adsorbed Cp*Ti(OCH3)3 is favored in the thermodynamic equilibrium state. The elimination reaction of CH3OH can occur more readily than that of Cp*H during the Cp*Ti(OCH 3)3 pulse. This conclusion is also confirmed by the QMS experimental results.

Original languageEnglish
Pages (from-to)179-184
Number of pages6
JournalThin Solid Films
Volume524
DOIs
Publication statusPublished - 1 Dec 2012

Keywords

  • Atomic layer deposition
  • Density functional theory
  • Dielectric
  • Titanium dioxide

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