Independent bad block management for mass storage flash memory arrays

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

As flash memory has advantages of high data throughput, high storage density, low power consumption and low cost, it has been widely used in the applications of high speed data acquisition and massive data storage. However, the flash chip generates bad blocks during its service life, which leads to the loss of data. Hence a bad block management in the system of flash memory array is essential to ensure the reliability of the data. The bad block management affects the storage capacity utilization, which is the main factor of the service life of the storage array. This paper introduces a new bad block management, in which each flash chip in the array has a corresponding bad block table. The computer simulation shows that the proposed scheme can improve the capacity utilization according to the size of the array.

Original languageEnglish
Title of host publicationICSESS 2015 - Proceedings of 2015 IEEE 6th International Conference on Software Engineering and Service Science
EditorsM. Surendra Prasad Babu, Li Wenzheng
PublisherIEEE Computer Society
Pages388-391
Number of pages4
ISBN (Electronic)9781479983520
DOIs
Publication statusPublished - 25 Nov 2015
Event6th IEEE International Conference on Software Engineering and Service Science, ICSESS 2015 - Beijing, China
Duration: 23 Sept 201525 Sept 2015

Publication series

NameProceedings of the IEEE International Conference on Software Engineering and Service Sciences, ICSESS
Volume2015-November
ISSN (Print)2327-0586
ISSN (Electronic)2327-0594

Conference

Conference6th IEEE International Conference on Software Engineering and Service Science, ICSESS 2015
Country/TerritoryChina
CityBeijing
Period23/09/1525/09/15

Keywords

  • bad block management
  • flash memory array
  • storage capacity utilization

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