In situ observation of electric-field-induced domain switching and crack propagation in poled PMNT62/38 single crystals

Yejian Jiang, Daining Fang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

It is important to in situ observe the crack propagation and the corresponding domain switching in ferroelectrics subjected to electric loading since domain switching has been widely assumed to play a critical role in the electric-field-induced crack growth. In this investigation, we in situ observed the crack propagation and the domain switching in PMNT62/38 single crystals poled along the [001] orientation. An experimental setup was designed and constructed to investigate the crack propagation and the domain switching in thin plate specimens with pre-crack subjected to electric field by using polarized light microscope (PLM). The pre-crack began to propagate forward accompanied by the appearance of domain switching zones near the crack tip and the disappearance of switched zones behind the crack tip at the unipolar electric field of E = 0.8EC. The results indicate that the structure mismatch of the adjacent switched zones with different polarizations stimulated by the intensive electric field near the crack tip results in the electric-field-induced crack growth.

Original languageEnglish
Pages (from-to)5047-5049
Number of pages3
JournalMaterials Letters
Volume61
Issue number28
DOIs
Publication statusPublished - Nov 2007
Externally publishedYes

Keywords

  • Crack growth
  • Deformation and fracture
  • Domain switching
  • Ferroelectrics
  • Single crystal

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