Illuminator design for small field ArF lithography system

  • Lidong Wei
  • , Yanqiu Li*
  • , Ke Liu
  • , Xiaolin Liu
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Design and development of small field ArF lithography system can achieve the prospective studies and key technologies for industrial lithography with low cost. An illuminator has been designed for the ArF projection lens which has a specification of 0.75 numerical aperture (NA), 70μm×70μm image field and x40 reduction ratio. The illuminator consists of 3 parts: fly's eye, condenser lens and beam shaping unit. A design method based on the fly's eye, which is the core and starting point, has been proposed. At first, the basic structure of fly's eye has to be determined. Then the first order of the condenser, such as focal length and the diameter of the stop can be derived when both the field size and illumination NA are guaranteed. At last, the stop diameter is used as the goal of the beam profile exiting from the beam shaping unit. Thus the initial parameters and relationship between various units in the illuminator can be determined. This method can also be used in full field system design. The NA of the illuminator (NA ILL) in the reticle space is 0.01875 and the illuminated area is 4mm×4mm. The telecentric degree is smaller than 6mrad, which guaranteed that the exit pupil of the illuminator match the entrance pupil of projection lens well. The illumination uniformity can reach 1.125% RMS (Root-Mean-Square) over the reticle with LightToolsTM. The results show that all the parameters meet the requirements of the small field ArF lithography system.

Original languageEnglish
Title of host publication6th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationAdvanced Optical Manufacturing Technologies
DOIs
Publication statusPublished - 2012
Event6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Xiamen, China
Duration: 26 Apr 201229 Apr 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8416
ISSN (Print)0277-786X

Conference

Conference6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Country/TerritoryChina
CityXiamen
Period26/04/1229/04/12

Keywords

  • Fly's eye
  • Illuminator
  • Optical design

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