High-Precision Classification of Parallel and Perpendicular Insects Based on Relative Eigenvalues of Dual-Frequency Scattering Matrices in the X-Band

Insects are categorized into two classes, “parallel (PA)” and “perpendicular (PE),” based on the relationship between radar cross section (RCS) values when the polarization direction is PA and PE to the insect body axis. Distinguishing between these classes is essential for accurately measuring insect orientation and morphological parameters. The current classification method relies on the relative phase sign of two eigenvalues from the insect’s polarization scattering matrix (SM). However, this method is susceptible to phase unwrapping errors and noise in practical applications. To enhance classification accuracy, the multifrequency characteristics of the relative amplitudes of SM eigenvalues, the polarization pattern shape, and insect class were analyzed using multifrequency SM data from both electromagnetic simulations and microwave anechoic chamber measurements. The analysis revealed that insect class can be distinguished based on the relative amplitude and phase of SM eigenvalues at two subfrequencies in the X-band. Building on this, a classification model for PA and PE insects was developed using the random forest (RF) algorithm, with the relative eigenvalues at 9.5 and 11.5 GHz as key features. Simulations demonstrated that the proposed method outperforms the traditional approach, particularly at low signal-to-noise ratios (SNRs). The model was then applied to a multifrequency, fully-polarimetric entomological radar, achieving 99.4% accuracy in distinguishing PA and PE insect classes based on body-axis alignment in the field. Finally, the reliability of the method was further validated through observations of freely flying migratory insects.