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High-precision 2D grating displacement measurement system based on double-spatial heterodyne optical path interleaving

  • Yunfei Yin
  • , Zhaowu Liu
  • , Shan Jiang
  • , Wei Wang
  • , Hongzhu Yu
  • , Galantu Jiri
  • , Qun Hao
  • , Wenhao Li*
  • *Corresponding author for this work
  • CAS - Changchun Institute of Optics Fine Mechanics and Physics
  • University of Chinese Academy of Sciences
  • Beijing Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

We propose a high-precision 2D grating displacement measurement system based on double-spatial heterodyne optical path interleaving. The system is based on Doppler-steering interferometry of 2D gratings, heterodyne interferometry, and double-spatial element-staggered configuration. We obtain long-stroke and high-precision real-time 2D displacement information using the optical phase change and interference signal decoupling caused by the 2D grating. The system is tested experimentally and compared with a laser interferometer, and found to have a measurement resolution within 3 nm. The error within a measurement of 40 mm is better than ±175 nm and ±150 nm in the 2D grating directions. The design is then optimized and tested, and the resulting error within the 40-mm range is better than +50 nm and −40 nm in the X-direction and +100 nm and −80 nm in the Y-direction. The results show that the proposed configuration improves the accuracy of the measurement system, is suitable for engineering testing, and has the potential for further improvement.

Original languageEnglish
Article number107167
JournalOptics and Lasers in Engineering
Volume158
DOIs
Publication statusPublished - Nov 2022
Externally publishedYes

Keywords

  • 2D grating
  • Displacement measurement
  • Double-spatial
  • Heterodyne
  • High-precision

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