Abstract
Surface acoustic wave (SAW) devices are essential devices for communication and sensing, but usually have an operation frequency limit well below 20 GHz due to the constraints of material properties and fabrication capability. By using an AlScN/diamond layered structure with a high electromechanical coupling coefficient K2 and our proposed two-step exposure electron beam lithography (EBL) process for ultra-fine patterns, we have fabricated SAW devices with resonant frequency up to 33.7 GHz in the Ka-band, the highest one ever reported for SAW devices electrically excited by interdigital transducers (IDTs). Combined with finite element analysis, we identified that series resonances are fundamental and high order Rayleigh modes, and K2 are in the range of 1.21%-2.32%, 200% higher compared to those of traditional AlN/diamond-based SAW devices. The high order modes become stronger and dominant, particularly suitable for the development of ultrahigh frequency SAW devices and applications. In addition, the proposed EBL process showed its superb capability to make ultra-fine IDTs down to the nano-scale with excellent smooth edges and uniform patterns, suitable for ultrahigh frequency SAW development.
| Original language | English |
|---|---|
| Article number | 093503 |
| Journal | Applied Physics Letters |
| Volume | 113 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 27 Aug 2018 |
| Externally published | Yes |
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