Abstract
Interactions of O2 or H2O with a GaP(111) surface were investigated over wide ranges of pressure and temperature using near-ambient pressure X-ray photoelectron spectroscopy. We demonstrated the formation of several oxygen-containing species from the dissociative adsorption of gas-phase molecules onto GaP(111). Chemical evolutions were determined at the gas/semiconductor interfaces based on changes in the high-resolution photoelectron spectra, which allowed us to identify the final products formed either directly or through intermediate species. We then used the Ga 2p3/2 spectra to create maps of the relative abundances of surface oxides and hydroxyl groups present under various experimental conditions. In the case of the O2/GaP(111) interface, we detected Ga-P bonds, and various oxygen-containing species, i.e., Ga2O, Ga2O3, and GaPOm. In the case of the H2O/GaP(111) interface, in addition to the detection of Ga-P bonds, species were formed with a different extent of oxidation and hydroxylation, On-Ga-(OH)3-n, via a Ga2O-like intermediate species. In both cases, the co-existence of multiple species represented as (GaPO)A or (GaPOH)B, was displayed under specific conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 564-573 |
| Number of pages | 10 |
| Journal | Topics in Catalysis |
| Volume | 59 |
| Issue number | 5-7 |
| DOIs | |
| Publication status | Published - 1 Mar 2016 |
| Externally published | Yes |
Keywords
- Gallium phosphide
- Gas/solid interface
- Near-ambient pressure XPS
- Surface oxidation
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