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GH-QFL: Enhancing Industrial Defect Detection Through Hard Example Mining

  • Xianjing Xiao
  • , Yan Du
  • , Rui Yang
  • , Runze Hu
  • , Xiu Li*
  • *Corresponding author for this work
  • Tsinghua University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the manufacturing sector, industrial defect detection technology has become a crucial component for substantial improvements in both product quality and production efficiency. However, the accuracy of deep learning-based defect detection methods can be compromised by uneven training data, which could result in a bias towards over-represented classes. To address this issue, some hard example mining (HEM) methods have been developed to balance the contribution of different classes during training. Nonetheless, on the custom dataset, these methods still inherit the hyper-parameters predefined on the COCO dataset. We thereby propose a novel loss function, called Gradient Harmonized Quality Focal Loss (GH-QFL), to weight hard examples dynamically based on gradient statistics. The proposed approach is evaluated on a defect detection dataset: NEU-DET. The results demonstrate that our method outperforms the detection method using other loss functions by 3.1 % mean average precision (mAP).

Original languageEnglish
Title of host publicationArtificial Neural Networks and Machine Learning – ICANN 2023 - 32nd International Conference on Artificial Neural Networks, Proceedings
EditorsLazaros Iliadis, Antonios Papaleonidas, Plamen Angelov, Chrisina Jayne
PublisherSpringer Science and Business Media Deutschland GmbH
Pages232-243
Number of pages12
ISBN (Print)9783031442063
DOIs
Publication statusPublished - 2023
Event32nd International Conference on Artificial Neural Networks, ICANN 2023 - Heraklion, Greece
Duration: 26 Sept 202329 Sept 2023

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume14254 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference32nd International Conference on Artificial Neural Networks, ICANN 2023
Country/TerritoryGreece
CityHeraklion
Period26/09/2329/09/23

Keywords

  • Defect detection
  • Hard example mining
  • Loss function

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