GeSi quantum dots studied by grazing incidence small angle X-ray scattering

Yuzhu Wang; Quanjie Jia; Yu Chen; Xianying Xue; Xiaoming Jiang; Jian Cui; Jianhui Lin; Zuimin Jiang; Qing He

GeSi quantum dots studied by grazing incidence small angle X-ray scattering

Yuzhu Wang^*, Quanjie Jia, Yu Chen, Xianying Xue, Xiaoming Jiang, Jian Cui, Jianhui Lin, Zuimin Jiang, Qing He

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Synchrotron radiation X-ray was used to carry out the grazing incidence small angle X-ray scattering (GISAXS) studies on GeSi quantum dots (QDs). The QDs sample was grown by molecular beam epitaxy method. Is-GISAXS program was used to simulate the GISAXS experiment data, the input parameters such as shape, size and inter-islands distance were obtained from atomic force microscopy observation, and the Distorted Wave Born Approximation theory and appropriate distribution function were employed to simulate the 1D and 2D GISAXS experiment pattern. The simulated results fit the experiment data very well, which proves that the GISAXS is an effective method to probe the microstructure information about shape, size, and distribution of GeSi QDs.

Original language	English
Pages (from-to)	250-254
Number of pages	5
Journal	He Jishu/Nuclear Techniques
Volume	31
Issue number	4
Publication status	Published - Apr 2008
Externally published	Yes

Keywords

GeSi
Grazing incidence small angle X-ray scattering (GISAXS)
Quantum dots

Cite this

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title = "GeSi quantum dots studied by grazing incidence small angle X-ray scattering",

abstract = "Synchrotron radiation X-ray was used to carry out the grazing incidence small angle X-ray scattering (GISAXS) studies on GeSi quantum dots (QDs). The QDs sample was grown by molecular beam epitaxy method. Is-GISAXS program was used to simulate the GISAXS experiment data, the input parameters such as shape, size and inter-islands distance were obtained from atomic force microscopy observation, and the Distorted Wave Born Approximation theory and appropriate distribution function were employed to simulate the 1D and 2D GISAXS experiment pattern. The simulated results fit the experiment data very well, which proves that the GISAXS is an effective method to probe the microstructure information about shape, size, and distribution of GeSi QDs.",

keywords = "GeSi, Grazing incidence small angle X-ray scattering (GISAXS), Quantum dots",

author = "Yuzhu Wang and Quanjie Jia and Yu Chen and Xianying Xue and Xiaoming Jiang and Jian Cui and Jianhui Lin and Zuimin Jiang and Qing He",

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TY - JOUR

T1 - GeSi quantum dots studied by grazing incidence small angle X-ray scattering

AU - Wang, Yuzhu

AU - Jia, Quanjie

AU - Chen, Yu

AU - Xue, Xianying

AU - Jiang, Xiaoming

AU - Cui, Jian

AU - Lin, Jianhui

AU - Jiang, Zuimin

AU - He, Qing

PY - 2008/4

Y1 - 2008/4

N2 - Synchrotron radiation X-ray was used to carry out the grazing incidence small angle X-ray scattering (GISAXS) studies on GeSi quantum dots (QDs). The QDs sample was grown by molecular beam epitaxy method. Is-GISAXS program was used to simulate the GISAXS experiment data, the input parameters such as shape, size and inter-islands distance were obtained from atomic force microscopy observation, and the Distorted Wave Born Approximation theory and appropriate distribution function were employed to simulate the 1D and 2D GISAXS experiment pattern. The simulated results fit the experiment data very well, which proves that the GISAXS is an effective method to probe the microstructure information about shape, size, and distribution of GeSi QDs.

AB - Synchrotron radiation X-ray was used to carry out the grazing incidence small angle X-ray scattering (GISAXS) studies on GeSi quantum dots (QDs). The QDs sample was grown by molecular beam epitaxy method. Is-GISAXS program was used to simulate the GISAXS experiment data, the input parameters such as shape, size and inter-islands distance were obtained from atomic force microscopy observation, and the Distorted Wave Born Approximation theory and appropriate distribution function were employed to simulate the 1D and 2D GISAXS experiment pattern. The simulated results fit the experiment data very well, which proves that the GISAXS is an effective method to probe the microstructure information about shape, size, and distribution of GeSi QDs.

KW - GeSi

KW - Grazing incidence small angle X-ray scattering (GISAXS)

KW - Quantum dots

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M3 - Article

AN - SCOPUS:43249088390

SN - 0253-3219

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SP - 250

EP - 254

JO - He Jishu/Nuclear Techniques

JF - He Jishu/Nuclear Techniques

IS - 4

ER -

GeSi quantum dots studied by grazing incidence small angle X-ray scattering

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