Focused ion beam methods and its applications in secondary batteries

Ni Yang; Yali Li; Lian Wang; Tinglu Song; Yuefeng Su

doi:10.2174/9789815305425124010005

Focused ion beam methods and its applications in secondary batteries

Ni Yang
, Yali Li
, Lian Wang
, Tinglu Song
, Yuefeng Su^*

^*Corresponding author for this work

School of Material Science and Engineering

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.

Original language	English
Title of host publication	Advanced Characterization Technologies for Secondary Batteries
Publisher	Bentham Science Publishers
Pages	37-74
Number of pages	38
ISBN (Electronic)	9789815305425
ISBN (Print)	9789815305432
DOIs	https://doi.org/10.2174/9789815305425124010005
Publication status	Published - 4 Nov 2024

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Cryo processing
Focused ion beam-scanning electron microscope
Lithium-ion battery
Three-dimensional reconstruction

Access to Document

10.2174/9789815305425124010005

Cite this

@inbook{325a54041fc84cd9bbd15a56b540bb2d,

title = "Focused ion beam methods and its applications in secondary batteries",

abstract = "This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.",

keywords = "Cryo processing, Focused ion beam-scanning electron microscope, Lithium-ion battery, Three-dimensional reconstruction",

author = "Ni Yang and Yali Li and Lian Wang and Tinglu Song and Yuefeng Su",

year = "2024",

month = nov,

day = "4",

doi = "10.2174/9789815305425124010005",

language = "English",

isbn = "9789815305432",

pages = "37--74",

booktitle = "Advanced Characterization Technologies for Secondary Batteries",

publisher = "Bentham Science Publishers",

address = "United Arab Emirates",

}

TY - CHAP

T1 - Focused ion beam methods and its applications in secondary batteries

AU - Yang, Ni

AU - Li, Yali

AU - Wang, Lian

AU - Song, Tinglu

AU - Su, Yuefeng

PY - 2024/11/4

Y1 - 2024/11/4

N2 - This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.

AB - This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.

KW - Cryo processing

KW - Focused ion beam-scanning electron microscope

KW - Lithium-ion battery

KW - Three-dimensional reconstruction

UR - https://www.scopus.com/pages/publications/85212029090

U2 - 10.2174/9789815305425124010005

DO - 10.2174/9789815305425124010005

M3 - Chapter

AN - SCOPUS:85212029090

SN - 9789815305432

SP - 37

EP - 74

BT - Advanced Characterization Technologies for Secondary Batteries

PB - Bentham Science Publishers

ER -

Focused ion beam methods and its applications in secondary batteries

Abstract

UN SDGs

Keywords

Access to Document

Other files and links

Fingerprint

Cite this