Focused ion beam methods and its applications in secondary batteries

This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.