Flash joining of alumina ceramics under a small current density

The ceramic joining using electric field (E-field) has garnered significant research attention due to the decreased joining barrier and enhanced reliability. However, the underlying mechanism of E-field assisted joining remains unclear. Herein, we report the rapid joining of alumina ceramics using a small current. Moreover, the E-field is applied in both perpendicular and parallel directions to the faying surfaces, demonstrating a significant difference in terms of joint strength. These results indicate that the E-field generates defects and promotes the joining process by facilitating ionic diffusion.