Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

Qingduan Meng; Xueqiang Zhang; Fei Li; Jiandong Huang; Xiaohong Zhu; Dongning Zheng; Bolin Cheng; Qiang Luo; Changzhi Gu; Yusheng He

doi:10.1002/pssa.200521385

Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

Qingduan Meng^*
, Xueqiang Zhang
, Fei Li
, Jiandong Huang
, Xiaohong Zhu
, Dongning Zheng
, Bolin Cheng
, Qiang Luo
, Changzhi Gu
, Yusheng He

^*Corresponding author for this work

CAS - Institute of Physics

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A new structure for the characterization of the permittivity of ferroelectric thin films at microwave frequencies is proposed. This new structure involves a coplanar waveguide (CPW) bandstop filter based on a ferroelectric thin film. Using the resonant frequency and Q value of the CPW bandstop filter, the dielectric constant (ε) and the loss tangent (tan δ) of the ferroelectric thin film were determined by comparing the measured responses with simulated results. To demonstrate this new structure, a CPW bandstop filter was fabricated on MgO substrate coated with Ba _0.5Sr _0.5TiO ₃ (BST-0.5). The dielectric parameters determined as a function of temperature and external bias are reported.

Original language	English
Pages (from-to)	379-385
Number of pages	7
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	203
Issue number	2
DOIs	https://doi.org/10.1002/pssa.200521385
Publication status	Published - Feb 2006
Externally published	Yes

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title = "Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter",

abstract = "A new structure for the characterization of the permittivity of ferroelectric thin films at microwave frequencies is proposed. This new structure involves a coplanar waveguide (CPW) bandstop filter based on a ferroelectric thin film. Using the resonant frequency and Q value of the CPW bandstop filter, the dielectric constant (ε) and the loss tangent (tan δ) of the ferroelectric thin film were determined by comparing the measured responses with simulated results. To demonstrate this new structure, a CPW bandstop filter was fabricated on MgO substrate coated with Ba 0.5Sr 0.5TiO 3 (BST-0.5). The dielectric parameters determined as a function of temperature and external bias are reported.",

author = "Qingduan Meng and Xueqiang Zhang and Fei Li and Jiandong Huang and Xiaohong Zhu and Dongning Zheng and Bolin Cheng and Qiang Luo and Changzhi Gu and Yusheng He",

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doi = "10.1002/pssa.200521385",

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T1 - Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

AU - Meng, Qingduan

AU - Zhang, Xueqiang

AU - Li, Fei

AU - Huang, Jiandong

AU - Zhu, Xiaohong

AU - Zheng, Dongning

AU - Cheng, Bolin

AU - Luo, Qiang

AU - Gu, Changzhi

AU - He, Yusheng

PY - 2006/2

Y1 - 2006/2

N2 - A new structure for the characterization of the permittivity of ferroelectric thin films at microwave frequencies is proposed. This new structure involves a coplanar waveguide (CPW) bandstop filter based on a ferroelectric thin film. Using the resonant frequency and Q value of the CPW bandstop filter, the dielectric constant (ε) and the loss tangent (tan δ) of the ferroelectric thin film were determined by comparing the measured responses with simulated results. To demonstrate this new structure, a CPW bandstop filter was fabricated on MgO substrate coated with Ba 0.5Sr 0.5TiO 3 (BST-0.5). The dielectric parameters determined as a function of temperature and external bias are reported.

AB - A new structure for the characterization of the permittivity of ferroelectric thin films at microwave frequencies is proposed. This new structure involves a coplanar waveguide (CPW) bandstop filter based on a ferroelectric thin film. Using the resonant frequency and Q value of the CPW bandstop filter, the dielectric constant (ε) and the loss tangent (tan δ) of the ferroelectric thin film were determined by comparing the measured responses with simulated results. To demonstrate this new structure, a CPW bandstop filter was fabricated on MgO substrate coated with Ba 0.5Sr 0.5TiO 3 (BST-0.5). The dielectric parameters determined as a function of temperature and external bias are reported.

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DO - 10.1002/pssa.200521385

M3 - Article

AN - SCOPUS:32144458246

SN - 1862-6300

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SP - 379

EP - 385

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

IS - 2

ER -

Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

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