Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution

Le Yang; Hao Sen Chen; Hanqing Jiang; Yu Jie Wei; Wei Li Song; Dai Ning Fang

doi:10.1039/c7cc09708e

Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution

Le Yang, Hao Sen Chen^*, Hanqing Jiang, Yu Jie Wei, Wei Li Song, Dai Ning Fang

^*Corresponding author for this work

Institute of Advanced Structure Technology

Research output: Contribution to journal › Article › peer-review

59 Citations (Scopus)

Abstract

An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

Original language	English
Pages (from-to)	3997-4000
Number of pages	4
Journal	Chemical Communications
Volume	54
Issue number	32
DOIs	https://doi.org/10.1039/c7cc09708e
Publication status	Published - 2018

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title = "Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution",

abstract = "An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.",

author = "Le Yang and Chen, {Hao Sen} and Hanqing Jiang and Wei, {Yu Jie} and Song, {Wei Li} and Fang, {Dai Ning}",

note = "Publisher Copyright: {\textcopyright} 2018 The Royal Society of Chemistry.",

year = "2018",

doi = "10.1039/c7cc09708e",

language = "English",

volume = "54",

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journal = "Chemical Communications",

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AU - Yang, Le

AU - Chen, Hao Sen

AU - Jiang, Hanqing

AU - Wei, Yu Jie

AU - Song, Wei Li

AU - Fang, Dai Ning

PY - 2018

Y1 - 2018

N2 - An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

AB - An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

UR - http://www.scopus.com/inward/record.url?scp=85045528195&partnerID=8YFLogxK

U2 - 10.1039/c7cc09708e

DO - 10.1039/c7cc09708e

M3 - Article

C2 - 29611854

AN - SCOPUS:85045528195

SN - 1359-7345

VL - 54

SP - 3997

EP - 4000

JO - Chemical Communications

JF - Chemical Communications

IS - 32

ER -

Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution

Abstract

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