Fabrication and structure of nanometer Zn1-xFexSe films

Lin Zhang*, Lian Sheng Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Nanometer Zn1-xFexSe diluted magnetic semiconductor films are fabricated by the double-source deposition. The crystal structure and phonon spectrum feature of the films were studied by X-ray diffraction and Ra-man-scattered spectra. The results show that the lattice parameter of the nanocrystals in Zn1-xFexSe films increases linearly with Fe concentration. The phonon localized effect is observed obviously from the Raman-scattered spectrum. The Raman-scattered peak corresponding to the optical phonon mode for Zn1-xFexSe films displays the broadening and red-shifting with respect to the bulk ZnSe. The expansion of lattice for the nanocrystals results in that the red-shifting of Raman-scattered peak increases linearly with Fe concentration.

Original languageEnglish
Pages (from-to)357-358+361
JournalGongneng Cailiao/Journal of Functional Materials
Volume36
Issue number3
Publication statusPublished - Mar 2005
Externally publishedYes

Keywords

  • Crystal structure
  • Diluted magnetic semiconductors
  • Nanocrystals film

Fingerprint

Dive into the research topics of 'Fabrication and structure of nanometer Zn1-xFexSe films'. Together they form a unique fingerprint.

Cite this