Experimental research of electronic devices thermal control using metallic phase change materials

Ai Gang Pan, Jun Biao Wang*, Xian Jie Zhang, Xiao Bao Cao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A Phase-change thermal control unit (PTCU) filled with metallic phase change material (PCM) Bismuth alloy for electric devices thermal protection was developed and investigated experimentally. The PTCU filled with PCM was designed and manufactured. Resistance heating components (RCHs) produced 1 W, 3 W, 5 W, 7 W, and 10 W for simulating heat generation of electronic devices. At various heating power levels, the performance of PTCU were tested during heating period and one duty cycle period. The experimental results show that the PTCU delays RCH reaching the maximum operating temperature. Also, a numerical model was developed to enable interpretation of experimental results and to perform parametric studies. The results confirmed that the PTCU is suitable for electric devices thermal control.

Original languageEnglish
Pages (from-to)113-121
Number of pages9
JournalJournal of Harbin Institute of Technology (New Series)
Volume21
Issue number2
Publication statusPublished - Apr 2014
Externally publishedYes

Keywords

  • Bismuth alloy
  • Electronic device
  • Metallic phase change materials
  • Thermal control

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