Abstract
Photon-counting polarimetric imaging provides more dimensional information compared to conventional imaging systems. We present a compact dual-wavelength infrared polarimetric light detection and ranging system operating at 1550 and 2004 nm, utilizing direct detection with superconducting nanowire single-photon detectors. This system achieves millimeter-scale resolution in both lateral and axial dimensions at a target distance of ∼1.3 m. Experimental results demonstrate an improved material discrimination advantage at low photon flux by integrating dual-band photon counting detection with polarimetric imaging, outperforming traditional intensity-based measurement methods. This work demonstrates broad application prospects in scenarios involving mid-infrared remote sensing and complex environmental exploration.
| Original language | English |
|---|---|
| Article number | 011102 |
| Journal | Chinese Optics Letters |
| Volume | 24 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2026 |
Keywords
- dual wavelength
- photon counting
- polarimetric imaging