Excitation to defect-bound band edge states in two-dimensional semiconductors and its effect on carrier transport

Dan Wang, Dong Han, Damien West, Nian Ke Chen, Sheng Yi Xie, Wei Quan Tian, Vincent Meunier, Shengbai Zhang, Xian Bin Li*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

The ionization of dopants is a crucial process for electronics, yet it can be unexpectedly difficult in two-dimensional materials due to reduced screening and dimensionality. Using first-principles calculations, here we propose a dopant ionization process for two-dimensional semiconductors where charge carriers are only excited to a set of defect-bound band edge states, rather than to the true band edge states, as is the case in three-dimensions. These defect-bound states have small enough ionization energies but large enough spatial delocalization. With a modest defect density, carriers can transport through band by such states.

Original languageEnglish
Article number8
Journalnpj Computational Materials
Volume5
Issue number1
DOIs
Publication statusPublished - 1 Dec 2019
Externally publishedYes

Fingerprint

Dive into the research topics of 'Excitation to defect-bound band edge states in two-dimensional semiconductors and its effect on carrier transport'. Together they form a unique fingerprint.

Cite this