Abstract
An interfacial-gated graphene phototransistor sensitized by silicon substrate with an ultrathin 3-nm Al2O3 dielectric layer is demonstrated. When applying gate voltages larger than a certain threshold, the phototransistor exhibits a photo-induced switching-on behavior, giving rise to its capacity of detecting light with the ultralow power of 470 pW, with a high responsivity of 1.4 × 104 A/W. The temporal measurements unveil a fast photoresponse speed with a rising time of 2μs. The novel channel on-state trigged by light was not observed in a control device with 16-nm Al2O3. The difference of transfer characteristics in the dark and under illumination is assigned mainly to the photo-assisted modification of the silicon depletion region.
| Original language | English |
|---|---|
| Pages (from-to) | 987-990 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 39 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2018 |
| Externally published | Yes |
Keywords
- Graphene
- depletion capacitance
- interfacial gating
- photodetector
Fingerprint
Dive into the research topics of 'Enhanced photoresponse in interfacial gated graphene phototransistor with ultrathin Al2O3 Dielectric'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver