Electron Transfer in Nanoscale Contact Electrification: Effect of Temperature in the Metal–Dielectric Case

  • Shiquan Lin
  • , Liang Xu
  • , Cheng Xu
  • , Xiangyu Chen
  • , Aurelia C. Wang
  • , Binbin Zhang
  • , Pei Lin
  • , Ya Yang
  • , Huabo Zhao
  • , Zhong Lin Wang*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The phenomenon of contact electrification (CE) has been known for thousands of years, but the nature of the charge carriers and their transfer mechanisms are still under debate. Here, the CE and triboelectric charging process are studied for a metal–dielectric case at different thermal conditions by using atomic force microscopy and Kelvin probe force microscopy. The charge transfer process at the nanoscale is found to follow the modified thermionic-emission model. In particular, the focus here is on the effect of a temperature difference between two contacting materials on the CE. It is revealed that hotter solids tend to receive positive triboelectric charges, while cooler solids tend to be negatively charged, which suggests that the temperature-difference-induced charge transfer can be attributed to the thermionic-emission effect, in which the electrons are thermally excited and transfer from a hotter surface to a cooler one. Further, a thermionic-emission band-structure model is proposed to describe the electron transfer between two solids at different temperatures. The findings also suggest that CE can occur between two identical materials owing to the existence of a local temperature difference arising from the nanoscale rubbing of surfaces with different curvatures/roughness.

Original languageEnglish
Article number1808197
JournalAdvanced Materials
Volume31
Issue number17
DOIs
Publication statusPublished - 25 Apr 2019
Externally publishedYes

Keywords

  • contact electrification
  • electron transfer
  • Kelvin probe force microscopy
  • temperature effect

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