Electron microscope speckle photography technique

A novel artificial sub-micron or nanometer speckle fabricating technique was proposed by taking advantage of sub-micron or nanometer particles. In the technique, sub-micron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as sub-micron or nanometer speckle by using a Scanning Electronic Microscope (SEM) at a special magnification. And, an Electron Microscope Speckle Photography (EMSP) method was developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial sub-micron or nanometer speckles. The principle of artificial sub-micron or nanometer speckle fabricating technique and the EMSP method were discussed in detail. The experimental results verified that the artificial sub-micron or nanometer speckle fabricating technique and EMSP method is feasible.