Abstract
We report the characterization of self-assembled epitaxially grown FeSi2 nanowires (NWs) in terms of electrical and magnetic properties. NWs grown by reactive deposition epitaxy (RDE) on silicon (110) show dimensions of 10nm × 5nm, and several micrometres in length. By using conductive-AFM (c-AFM), electron transport properties of one single NW is measured, resistivity of a single crystalline FeSi'2 NW is estimated to be 225 μΩcm. Using superconducting quantum interference device (SQUID), we measure a magnetic moment of 0.3 0.1 Bohr magneton per iron atom for these FeSi2 NWs.
| Original language | English |
|---|---|
| Pages (from-to) | 4113-4116 |
| Number of pages | 4 |
| Journal | Chinese Physics Letters |
| Volume | 25 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1 Nov 2008 |
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