Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates

Yi Tian; Hui Yan; Xin Wang; Li Zhang; Zhuo Li

doi:10.1117/1.OE.54.2.025109

Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates

Yi Tian, Hui Yan, Xin Wang, Li Zhang, Zhuo Li^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators E_pv, E_rms, φ_pv, and φ_rms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.

Original language	English
Article number	025109
Journal	Optical Engineering
Volume	54
Issue number	2
DOIs	https://doi.org/10.1117/1.OE.54.2.025109
Publication status	Published - 1 Feb 2015
Externally published	Yes

Keywords

electromagnetic diffraction
near fields
physical theory of diffraction

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10.1117/1.OE.54.2.025109

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title = "Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates",

abstract = "A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.",

keywords = "electromagnetic diffraction, near fields, physical theory of diffraction",

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note = "Publisher Copyright: {\textcopyright} 2015 Society of Photo-Optical Instrumentation Engineers.",

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T1 - Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates

AU - Tian, Yi

AU - Yan, Hui

AU - Wang, Xin

AU - Zhang, Li

AU - Li, Zhuo

PY - 2015/2/1

Y1 - 2015/2/1

N2 - A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.

AB - A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.

KW - electromagnetic diffraction

KW - near fields

KW - physical theory of diffraction

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VL - 54

JO - Optical Engineering

JF - Optical Engineering

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ER -

Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates

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Keywords

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