Abstract
We report the thickness dependence of critical current density (Jc) in YBa2Cu3O7-x (YBCO) films with BaZrO3 (BZO) and Y2O3 additions grown on single crystal LaAlO3 substrates by metalorganic deposition using trifluoroacetates (TFA-MOD). Comparing with pure YBCO films, the Jc of BZO/Y2O3-doped YBCO films was significantly enhanced. It was also found that with the increase of the thickness of YBCO film from 0.25 μm to 1.5 μm, the Ic of BZO/Y2O3-doped YBCO film increased from 130 A/cm to 250 A/cm and yet Jc of YBCO film decreased from 6.5 MA/cm2 to 2.5 M A/cm2. The thick BZO/Y2O3-doped MOD-YBCO film showed lower Jc, which is mainly attributed to the formation of a-axis grains and pores.
| Original language | English |
|---|---|
| Article number | 057401 |
| Journal | Chinese Physics B |
| Volume | 24 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1 May 2015 |
| Externally published | Yes |
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