Abstract
In this study, we investigated the effects of rare earth terbium (Tb) doping on the structure and optical properties of Ga2O3 thin films. The films were deposited on sapphire substrates with Tb concentration ranging from 0.53 at.% to 15.35 at.% and subsequently subjected to high temperature annealing. For films with lower Tb concentrations (i.e., less than 1.25 at.%), X-ray diffraction indicates the formation of the monoclinic phase β-Ga2O3; film crystallinity, characterized by the sizes of crystalline Ga2O3 particles, improves as the annealing temperature increases from 800 °C to 1100 °C. In films with higher Tb concentration, transmission electron microscopy reveals the formation and distribution of terbium gallium oxide (i.e., Tb3Ga5O12) and Tb oxides (i.e., TbO1.75) in different regions of the films. Strong Tb3+ photoluminescence (PL) was observed in films with lower Tb concentrations, whereas both Tb3+ PL and emissions from oxygen vacancies decrease significantly with increasing Tb concentration. The ultraviolet–visible spectra of the films show that the optical transmittance decreases with increasing Tb concentration, while the optical bandgap has a weak dependence on Tb concentration. X-ray photoemission spectra indicate a decrease in oxygen vacancies but an increase of Tb3+ content as Tb concentration increases, consistent with the changes observed in the PL spectra. This study may contribute to expanding the applications of Ga2O3-based photonics.
| Original language | English |
|---|---|
| Article number | 121523 |
| Journal | Journal of Luminescence |
| Volume | 288 |
| DOIs | |
| Publication status | Published - Dec 2025 |
| Externally published | Yes |
Keywords
- Magnetron sputtering
- Optical properties
- Tb doping
- Thin films
- β-GaO