Effects of nitrogen and oxygen partial pressure on the structural and optical properties of ZnO:N thin films prepared by magnetron sputtering

Huiping Lu, Peipei Zhou, Haonan Liu, Linao Zhang, Yang Yu, Yinglan Li, Zhi Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

Nitrogen doped ZnO films were prepared by magnetron sputtering. We studied the influence of nitrogen partial pressure pn and oxygen partial pressure po on the microstructure, morphology and optical properties of the thin films. The results show that different defects influence the structure and optical behavior of the films. Doping-related tensile stress turns compressive, owing to a different N-doping form in the films. Red-shift of absorption edge was observed with increasing pn and decreasing po. Band-gap narrowing is improved by increasing nitrogen substitute and oxygen vacancies.

Original languageEnglish
Pages (from-to)123-126
Number of pages4
JournalMaterials Letters
Volume165
DOIs
Publication statusPublished - 15 Feb 2016
Externally publishedYes

Keywords

  • N-doping
  • Optical materials and properties
  • Sputtering
  • Thin films
  • ZnO

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